Raman Analyzer can assist in the study of the molecular basic properties of semiconductor materials, such as single element semiconductors, such as silicon (SI), germanium (GE) and multi-component semiconductors, such as gallium arsenide (GaAs), gallium nitride (GAN), silicon carbide (SIC). The molecular properties of semiconductor wafer materials determine the wafer manufacturing. IC packaging is the good rate and quality of these processes. The Raman Analyzer can be used to measure the concentration of germanium in semiconductor, crystallinity, strain and stress of materials.

Due to the high quality inspection and requirements of wafer feed due to the large use of the third generation semiconductor materials, i-Bot technology has been looking for the TOP technology to act as its analyzer and develop the automatic Raman  Analyzer.